超薄电子玻璃波纹度与密度关系研究

Research on the Relationship between Surface Morphology Waviness and Density of Ultra-thin Electronic Glass

玻璃表面波纹度是影响浮法超薄电子玻璃质量的重要因素,通过光检条纹仪区分出玻璃的明暗条纹,研究退火前后超薄玻璃明暗条纹处的密度变化规律。结果表明,玻璃明暗条纹处的密度差是造成玻璃表面波纹度、形成光检条纹的直接原因之一。超薄电子玻璃波纹度产生的根本原因在于明暗条纹处成分的微不均匀,可通过提高配合料、熔化和成形工艺的稳定性,改善玻璃成分的均匀性来优化玻璃表面质量。

Glass surface morphology waviness is an important factor affecting the quality of float ultra-thin electronic glass.The light and dark fringes of glass are distinguished by fringe meter,and the density variation law of the light and dark fringes before and after annealing are studied.The results show that the density difference between light and dark fringes of glass is one of direct reasons for the morphology waviness and optical fringes.The morphology waviness of ultra-thin electronic glass primary caused by micro-uneven composition between light and dark fringes.The glass surface quality can be optimized by improving the stability of the compounding,melting,forming process and enhancing the unifomity of the glass composition.