摘要
阐述电子器件的可靠性评估指标,加速寿命测试、退化度量、失效分析的可靠性测试技术方法。探讨可靠性评估技术,包括基于概率统计和物理可靠性的评估方法、可靠性分析软件,提出电子元器件的可靠性测试与评估实践。
This paper expounds the reliability evaluation indicators of electronic devices,as well as the reliability testing techniques and methods for accelerated life testing,degradation measurement,and failure analysis.It explores reliability evaluation techniques,including evaluation methods based on probability statistics and physical reliability,reliability analysis software,and proposes reliability testing and evaluation practices for electronic components.
作者
申德玮
刘涛
刘小建
SHEN Dewei;LIU Tao;LIU Xiaojian(Yunnan Kunchuan Electronic Equipment Co.,Ltd.,Yunnan 650236,China)
出处
《集成电路应用》
2023年第12期383-385,共3页
Application of IC
关键词
电子器件
可靠性
器件测试
评估技术
electronic devices
reliability
device testing
evaluation techniques