摘要
以JEM-1400透射电子显微镜为例,介绍了透射电镜的基本结构、工作方式、电子光学成像原理及分辨率、放大倍率等基本概念,探讨了影响纳米材料样品高质量成像的因素及对策。从灯丝高度及束流强度调试方面讨论了提高材料样品分辨率的可行性:基于灯丝像,通过调节灯丝饱和度和偏压,使灯丝发射量达到15μA;在保证灯丝寿命的前提下,分辨率从过去的200 nm提高到10 nm以下。
Taking the JEM-1400 transmission electron microscope as an example,the basic structure and working mode of the electron microscope,the principle of the electron optical imaging system and the basic concepts such as resolution and magnification have been introduced.This paper discusses the factors affecting the high-quality imaging of nano material samples and the countermeasures,discusses the feasibility of improving the resolution of material samples from the aspects of filament height and beam intensity debugging.Based on the filament image,by adjusting the filament saturation and bias voltage,the filament emission can reach 15 μA.On the premise of ensuring the service life of the filament,the resolution is improved from 200 nm to less than 10 nm.
作者
韩沐昕
李冬梅
赵晟锌
Han Muxin;Li Dongmei;Zhao Shengxin(Heilongjiang College of Construction,Harbin,150025,China;School of Environmental Engineering,Harbin Institute of Technology,Harbin,150090,China)
出处
《中国现代教育装备》
2024年第3期26-28,32,共4页
China Modern Educational Equipment
基金
国家自然科学基金项目“ARGs在寒地城市污水系统中的传播扩散、影响机制及预测模拟研究”(编号:51979066)
哈尔滨工业大学大型设备维修基金项目
哈尔滨工业大学研究生教育教学改革项目(编号:23HX013)
黑龙江省教育科学“十四五”规划2021年度重点课题“环境微生物群落结构与演替解析实验混合式教学的研究与实践”(编号:GJB142042)。
