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An Advanced Image Processing Technique for Backscatter-Electron Data by Scanning Electron Microscopy for Microscale Rock Exploration

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摘要 Backscatter electron analysis from scanning electron microscopes(BSE-SEM)produces high-resolution image data of both rock samples and thin-sections,showing detailed structural and geochemical(mineralogical)information.This allows an in-depth exploration of the rock microstructures and the coupled chemical characteristics in the BSE-SEM image to be made using image processing techniques.Although image processing is a powerful tool for revealing the more subtle data“hidden”in a picture,it is not a commonly employed method in geoscientific microstructural analysis.Here,we briefly introduce the general principles of image processing,and further discuss its application in studying rock microstructures using BSE-SEM image data.
出处 《Journal of Earth Science》 SCIE CAS CSCD 2024年第1期301-305,共5页 地球科学学刊(英文版)
基金 funded by the National Natural Science Foundation(No.42261134535) the National Key Research and Development Program(No.2023YFE0125000) the Frontiers Science Center for Deep-time Digital Earth(No.2652023001) the 111 Project of the Ministry of Science and Technology(No.BP0719021) supported by the department of Geology,University of Vienna(No.FA536901)。
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