辐射效应易损性仿真能力建设的现状与展望

Current Status and Prospects of Simulation Capacityof Radiation Effects Vulnerability

基础应用软件关系到国家的战略安全,受国外严密封锁,已成为国家战略发展的迫切需求。本文作者团队围绕辐射效应易损性仿真,针对如何构建电子器件模型、如何引入辐射效应扰动项、如何设定效应判据及判定计算结果是否准确等方面展开了系统研究。利用仿真手段,预测电子器件受不同类型辐射效应影响后发生性能退化、功能异常、故障甚至损毁的效应规律与失效阈值;率先将抗辐射性能评估融入集成电路设计流程,成功实现在设计阶段预测抗辐射性能;开发了集成于商用芯片设计与仿真平台的TREES 1.0,不依赖于国外软件的自主化版本TREES 2.0及升级版本SREES 1.0,并已通过应用验证与第三方测试,为在当前特定情况下实现抗辐射加固芯片自主可控奠定了基础。本文综述了电子器件辐射效应易损性分析软件的国内外发展现状,重点介绍本文作者团队在自主可控软件开发方面的研究进展与未来规划。

Basic software is related with national strategic security.In face of blockade from abroad,it plays an important role in the development of national strateg.A lot of works have been done in the field of radiation effects vulnerability simulation,regarding how to model the electronic devices,how to introduce the impact of radiation effects,how to determine the failure,and how to verify the simulation results.By means of simulation methods,behavior pattern and failure threshold of performance degradation,malfunction,even breakdown of electronic devices against radiation effects can be predicted.Through integrating radiation vulnerability evaluation into the procedure of integrated circuit design,performance against radiation effects can be predicted at design phase.A series of softwares have been developed,including TREES 1.0 which is integrated into commercial platform,TREES 2.0 which is stand alone and independent of foreign software,and SREES 1.0 which is supported by national key projects.Till now,SREES 1.0 has passed application verification and test by a third party,laying the foundation for producing independently controllable radiationhardened chip.Development status of radiation vulnerability evaluation software at home and abroad is reviewed.And in this paper then,the research progress of our team will be presented.