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基于双核锁步的多核处理器SEU加固方法

SEU Reinforcement Method for Multicore Processors Based on Dual Core Lockstep
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摘要 以单粒子翻转为代表的软错误是制约COTS器件空间应用的主要因素之一;为了满足空间应用对高集成卫星电子系统抗辐照防护的要求,提出了一种面向通用多核处理器的单粒子翻转加固方法,通过软件层面双核互检,在不额外增加硬件开销的前提下,充分提高了COTS器件的可靠性,具有良好的可移植性和较强的工程实用价值;进行软件故障注入实验,在程序执行的关键节点注入错误信息,验证该双核互检方法实用性;实验结果表明双核互锁方法可以100%检测出系统中产生的单粒子翻转,抗软错误能力满足应用需要。 It is one of the main factors restricting the spatial application of commercial off-the-shelf(COTS)devices for the soft error represented by single event flipping;In order to meet the requirements of radiation protection for highly integrated satellite electronic systems in space applications,a single event flip reinforcement method for general multi-core processor is proposed.Through the dual core and mutual inspection in software level,the reliability of COTS devices is fully improved without additional hardware overhead,with a good portability and strong engineering practical value;The software fault injection experiments are conducted to inject the error information at the key nodes during execution program,and verify the practicality of the dual core and mutual inspection method;The experimental results show that the dual core interlocking method can fully detect the single event flipping generated in the system,and meet the application of its ability to resist soft errors.
作者 郭强 伍攀峰 许振龙 GUO Qiang;WU Panfeng;XU Zhenlong(Shandong Aerospace Electronic Science and Technology Research Institute,Yantai 264006,China;School of Astronautics,Harbin Institute of Technology,Harbin 150001,China)
出处 《计算机测量与控制》 2024年第3期293-299,共7页 Computer Measurement &Control
关键词 双核锁步 抗辐射加固 单粒子翻转 多核处理器 软件故障注入 dual core lock step radiation hardening single-event upset(SEU) multicore processor software fault injection
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