能量色散X射线荧光分析的应用——内标法分析硅酸盐中Sr、Rb

DETERMINATION OF RUBIDIUM, STRONTIUM IN SILICATE SAMPLES BY ENERGY-DISPERSIVE X-RAY FLUORESCENCE METHOD

波长色散X射线荧光光谱分析在国内一些较大的无机分析研究所和实验室比较常见亦较为成熟。而能量色散X射线荧光光谱分析(以下简称X荧光能谱分析)的应用在国内还不多见。有几个单位开展了以放射源作激发源的X荧光能谱分析,由于受放射源强度的限制,所以分析灵敏度低。我们利用中子活化分析用的美国SCORPIO—3000系统程序控制多道能谱仪和Si(Li)探测器,以及一台苏制YPC—50M型X光机并自制试样架,组成一台X荧光能谱仪(图1),开展X荧光能谱分析,实现了能谱仪多功能利用。

This paper descibes the determination of Rb and Sr in silicate samples by energy-dispersive X-Ray fluorescence method, in which the internal-standard method was used. The C.V. for 17 determinations were 4.6 and 3.4% for 0.1% Rb and Sr, respectively. The sensitivity of this method were 0.0003% for Sr and 0.001% for Rb.