p型“SE+PERC”双面太阳电池背面工艺对光伏组件PID效应的影响研究

RESEARCH ON INFLUENCE OF BACK TECHNOLOGY OF p-TYPE“SE+PERC”BIFACIAL SOLAR CELLS ON PID EFFECT OF PV MODULES

基于p型“SE+PERC”双面太阳电池的背面工艺,针对背表面抛光状态、背面氧化铝薄膜厚度、背面膜层结构、背面氮化硅薄膜折射率几个因素对光伏组件电势诱导衰减(PID)效应的影响进行了研究。研究结果表明:1)背表面抛光状态越光滑,对应制备的光伏组件在PID测试后的输出功率损失率越小;2)背面氧化铝薄膜厚度为10 nm及以上时对应制备的光伏组件在PID测试后的输出功率损失率差异不大;3)背面膜层结构对PID效应存在影响,合理设计背面膜层结构可以有效抑制光伏组件PID效应;4)背面氮化硅薄膜折射率大于等于2.10时,对应制备的光伏组件在PID测试后的输出功率损失率降至2.00%以内且可以稳定保持在较低水平。研究结果可为p型“SE+PERC”双面太阳电池背面工艺优化提供指导方向。

Based on the back technology of p-type"SE+PERC"bifacial solar cells,this paper studies the influence of the back surface polishing state,the thickness of Al2O3 thin film on the back,the film structures on the back,and the refractive index of SixNy thin films on the back on the potential induced attenuation(PID)effect of PV modules.The research results show that:1)The smoother the polishing state of the back surface,the smaller the output power loss rate of the PV module prepared after PID testing.2)When the thickness of the Al2O3 thin film on the back is 10 nm or more,there is not much difference in the output power loss rate of the PV module prepared after PID testing.3)The film structure on the back has an impact on the PID effect,and reasonable design of the film structure on the back can effectively inhibit the PID effect of PV modules.4)When the refractive index of the SixNy thin film on the back is greater than or equal to 2.10,the output power loss rate of the PV module prepared after PID testing decreases to within 2.00%and can be stably maintained at a lower level.The research results can provide guidance for the optimization of the back technology of p-type"SE+PERC"bifacial solar cells.