一种数字后端设计DFT的方法分析

Analysis of a Digital Backend Design DFT Method

阐述可测试性设计(DFT)的特点。分析一种ASIC设计中DFT的方法,包括定义扫描链、定义测试信号、提取扫描链、写入测试协议,使设计人员可以优化最终芯片制造的功耗、面积和时序。

This paper expounds the characteristics of Design for Testability(DFT).It analyzes a method of DFT in ASIC design,including defining scan chains,defining test signals,extracting scan chains,and writing test protocols,allowing designers to optimize the power consumption,area,and timing of final chip manufacturing.