直流接触器触头倒角及中心磁感应强度对电寿命的影响

Effect of Chamfer and Center Magnetic Induction on Electrical Life of DC Contactors

密封直流接触器开断负载时,灭弧室内触头喷溅不可避免。通过分组试验的方法来验证触头倒角及中心磁感应强度对电寿命的影响。结果表明,增大触头中心磁感应强度,总开断负载的次数会增加,喷溅也会增多,从而导致介质耐电压和绝缘电阻降低;增大触头倒角,喷溅会减少,介质耐电压和绝缘电阻会提高,但总开断负载的次数会减少。

When the sealed DC contactor breaks the load,the splashing of contacts in the arc extinguishing chamber is inevitable.The influence of contact chamfering and center magnetic induction on electrical life is verified by grouping test.The results show that with the increasing of contact center magnetic induction,the total number of breaking load will be increased,but the spattering will also be increased,which will lead to the decrease of dielectric voltage resistance and insulation resistance.The spattering will be decreased with the increasing of contact chamfer,the dielectric voltage and insulation resistance will be increased,but the total number of breaking load will be reduced.