摘要
In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment.
基金
the National Natural Science Foundation of China(61306046,61640421)
the Yicheng Elite Project(202371)
the Open Project of National Local Joint Engineering Laboratory of RF Integration and Micro-assembly Technology(KFJJ20230101)
the National Key Laboratory of Integrated Chips and Systems Project(SLICS-K202316)
the Anhui University Research Project(2023AH050481)
the Research on Testing Methods and Accuracy of High Frequency Signal Chips(2023AH050500)。
