摘要
采用光刻胶涂覆、PVD、PECVD和RIE方法制备的类金刚石(DLC)薄膜覆盖于SiC晶片表面,作为SiC离子注入后高温激活退火的保护层,高温退火后晶片表面均无明显形貌退化,从薄膜应力、厚度、产能及成本等方面对4种方法进行了对比和分析。
Diamond-like carbon(DLC)films prepared by photoresist coating,PVD,PECVD and RIE cover the surface of SiC wafer as the protective layer for high-temperature activation annealing after SiC ion implantation.There is no obvious morphological degradation on all the wafer surfaces after high-temperature annealing.The four methods are compared and analyzed from the aspects of film stress,thickness,productivity and cost.
作者
刘相伍
李波
陟金华
朱江涛
LIU Xiangwu;LI Bo;ZHI Jinhua;ZHU Jiangtao(Beijing Advanced Semiconductor Innovation Co.,Ltd.,Beijing 101318,China)
出处
《电子工业专用设备》
2024年第3期9-12,共4页
Equipment for Electronic Products Manufacturing
关键词
碳化硅
类金刚石
高温退火
SiC(Silicon carbide)
DLC(Diamond-like carbon)
High temperature anneal