标准加入-电感耦合等离子体发射光谱法(ICP-OES)测定直馏石脑油中硅含量

Standard Addition Inductively Coupled Plasma Atomic Emission Spectroscopy(ICP-OES)for the Determination of Silicon Content in Straight-run Naphtha

直馏石脑油是一种轻质馏分油,易挥发,故采用标准加入-电感耦合等离子体发射光谱法(ICP-OES)以冷进样的方式测定直馏石脑油中硅含量。对仪器分析参数中元素检测波长和观测角度,以及辅助设备氧气流量和冷却温度进行了研究。通过试验选择了硅元素检测波长为:251.61nm;观测角度:径向;氧气流量0.02L·min-1;冷却温度:-5℃作为仪器参数。还对方法的工作曲线、定量限、精密度和回收率进行了考察。结果表明:标准加入-电感耦合等离子体发射光谱法(ICP-OES)测定直馏石脑油中硅含量的方法准确度和精密度均能满足分析要求。

Straight-run naphtha is a kind of light distillation oil,which is easy to volatilize.Because of this,trace silicon content in straight-run naphtha was determined by inductively coupled plasma optical emission spectroscopy(ICP-OES)with standard addition method.The instrumen-tal analysis parameters,including the detection wavelength and viewing angle for element measurement,as well as the auxiliary equipment such as oxygen flow rate and cooling temperature,were investigated.Experimental results indicated that the optimal parameters for silicon detection were a detection wavelength of 251.61 nm,radial viewing angle,oxygen flow rate of 0.02 L·min-1,and cooling temperature of-5℃.The method's working curve,quantification limit,precision,and recovery rate were evaluated.The results show that inductively coupled plasma optical emission spectros-copy(ICP-OES)with standard addition method to determine the trace silicon content in straight-run naphtha can meet the analysis requirements.