连续真空蒸发法制备CsPbBr_(3)薄膜及其X射线探测性能的分析

Analysis of Preparation of CsPbBr_(3)Thin Films by Continuous Vacuum Evaporation Method and X-ray Detection Performance

阐述采用连续蒸发法制备一定厚度的CsPbBr_(3)薄膜并用于X射线探测。研究CsBr层和PbBr2层的厚度比对CsPbBr_(3)薄膜物性的影响。结果表明,在厚度比为0.85时,可获得纯立方相结构的CsPbBr_(3)薄膜,并通过衬底原位加热的方式有效解决薄膜出现龟裂而脱落的问题,同时促进薄膜晶粒的长大。制备的CsPbBr_(3)薄膜X射线探测器的光电流与X射线剂量率之间呈现出良好的线性关系。器件的线性灵敏度达1223μCGy^(-1)cm^(-2)。

This paper describes the preparation of CsPbBr_(3)thin films with a certain thickness using continuous evaporation method and their application in X-ray detection.Study the effect of thickness ratio of CsBr layer and PbBr_(2)layer on the physical properties of CsPbBr_(3)thin films.The results indicate that a pure cubic structured CsPbBr_(3)film can be obtained at a thickness ratio of 0.85,and the problem of film cracking and detachment can be effectively solved by in-situ substrate heating,while promoting the growth of film grains.There is a good linear relationship between the photocurrent and X-ray dose rate of the CsPbBr_(3)thin film X-ray detector prepared.The linear sensitivity of the device reaches 1223μCGy^(-1)cm^(-2).