期刊文献+

塑封器件使用风险与应对措施分析

Analysis of Risk and Countermeasures for the Use of Plastic Encapsulated Microcircuits
下载PDF
导出
摘要 阐述塑封器件使用中的风险,包括温度适应性、潮气入侵、塑封器件分层、高可靠领域使用商用塑封器件。从器件选用和保证、可靠性评估保证措施方面,提出塑封器件使用的应对措施。 This paper describes the risks in the use of plastic packaging devices,including temperature adaptability,moisture intrusion,delamination of plastic packaging devices,and the use of commercial plastic packaging devices in highly reliable fields.It proposes countermeasures for the use of plastic sealed devices from the aspects of device selection and assurance,reliability evaluation and assurance measures.
作者 李泱 王宇 王思思 贾博涛 郭焕焕 LI Yang;WANG Yu;WANG Sisi;JIA Botao;GUO Huanhuan(China Academy of Launch Vehicle Technology,Beijing 100076,China)
出处 《集成电路应用》 2024年第5期72-73,共2页 Application of IC
关键词 集成电路 塑封器件 可靠性评估 integrated circuits plastic encapsulated devices reliability assessment
  • 相关文献

参考文献2

二级参考文献11

  • 1郭伟,葛秋玲.塑封集成电路的抗潮湿性研究[J].电子与封装,2005,5(4):16-19. 被引量:7
  • 2刘涌,柯行鉴.国外塑封微电路的可靠性改进技术概况[J].电子产品可靠性与环境试验,1997,15(4):35-38. 被引量:3
  • 3PEARSON R A,LLOYD T B,AZIMI H R,et al.Adhesion issues in epoxy-based chip attach adhesives[J].IEEE Trans Compon,Packag,and Manufac Technol,Part A,2003,20 (1):31-37.
  • 4GEKTIN V,COHEN A B.Mechanistic figures of merit for die-attach materials[C] // Inter-Society Conf Thermal Phenomena in Electronic Systems.Orlando,FL,USA.1996:306-313.
  • 5RAHIM M K,SUHLING J C,et al.Fundamental of delamination initiation and growth in flip chip assemblies[C] // Proc IEEE Elec Compon and Technol Conf.Orlando,FL,USA.2005:1172-1186.
  • 6CUSSLER E L.扩散:流体系统中的传质[M].王宇新,姜忠义,译.北京:化学工业出版社,2002.
  • 7WONG E H,KOH S W,LEE K H,et al.Advanced moisture diffusion modeling and characterization for electronic packaging[C] // Proc Elec Compon and Technol Conf.USA.2002:1297-1303.
  • 8周军连,王蕴辉,唐云.塑封微电路在高可靠领域的应用、筛选与鉴定[J].电子产品可靠性与环境试验,2007,25(5):48-51. 被引量:7
  • 9TEVEROVSKY A. Instructions for Plastic Encapsulated Microcircuit (PEM) Selection, Screening, and Qualification [J]. NASA/TP-2003-212244: 9.
  • 10邹小花,王永忠,周鸣新.塑封集成电路离层对可靠性的影响及解决方法[J].电子与封装,2009,9(5):15-17. 被引量:12

共引文献6

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部