X射线荧光分析仪检测数据超差原因分析及解决措施

Analysis of the Causes and Solutions for the Data Deviation Detected by X-ray Fluorescence Analyzer

某水泥公司采用X射线荧光分析仪进行生料样品SiO_(2)、CaO等成分检测时,出现检测数据频繁超出误差的现象。分析了可能造成X射线荧光分析仪检测数据产生误差的影响因素,试验排除了操作误差及仪器误差的影响,发现检测数据超差的主要原因是试样制备方法重复性较差,进一步排查影响试样制备的因素,确定了颗粒效应对检测数据超差的影响。通过采取将样品研磨至完全通过0.08mm方孔筛的粉磨试验方案,最终解决了X射线荧光分析仪超差的问题,提高了熟料产品质量。

When a cement company used X-ray fluorescence analyzer to detect SiO_(2),CaO and other components of raw material samples,the detection data frequently exceeded the error phenomenon.The factors that may cause the error of X-ray fluorescence analyzer test data were analyzed,and the effects of operation error and instrument error were excluded in the test.It was found that the main reason for the error of test data was the poor repeatability of sample preparation method.The factors affecting sample preparation were further investigated,and the influence of particle effect on the error of test data was determined.By grinding the sample to pass the 0.08mm square screen,the problem of X-ray fluorescence analyzer was solved and the quality of clinker was improved.