基于介电损耗的电磁线圈匝间绝缘寿命研究

Research on the Interturn Insulation Life of Electromagnetic Coils Based on Dielectric Loss

低压电磁线圈作为电气设备的核心部件,其匝间绝缘失效问题尤其突出。为评估低压电磁线圈匝间绝缘寿命,对制作的双绞线试样在210℃、230℃、250℃下分别进行10个老化周期的加速热老化试验,探究热应力对其电气性能的影响规律。结果表明,随着老化温度升高、老化时间增加,介电损耗与之呈现出直接正相关变化规律。为此提出一种基于介电损耗的失效率模型判断匝间绝缘寿命,并根据Arrhenius模型拟合温度寿命曲线对所提出失效率模型进行精度验证。结果表明,所提出基于介电损耗的失效率模型误差率为0.744%,对评估匝间绝缘寿命具有较高的准确性。

As the core component of electrical equipment,low-voltage electromagnetic coils have a particularly prominent problem of inter turn insulation failure.To evaluate the insulation life between turns of low-voltage electromagnetic coils,accelerated thermal aging tests were conducted on the twisted pair samples made at 210℃,230℃and 250℃for 10 aging cycles respectively,to explore the influence of thermal stress on their electrical performance.The results show that as the aging temperature increases and the aging time increases,the dielectric loss shows a direct positive correlation with it.A failure rate model based on dielectric loss is proposed to determine the inter turn insulation life,and the accuracy of the proposed failure rate model is verified by fitting the temperature life curve with the Arrhenius model.The results show that the proposed failure rate model based on dielectric loss has an error rate of 0.744%,which has high accuracy in evaluating the inter turn insulation life.