摘要
阐述集成电路40nm工艺中的低温注入替代技术,从机理出发,通过实验,发现采用同族其他元素的常温注入来替代低温注入可实现同样的功能,从而实现高效率和低能耗的要求。
This paper describes the low-temperature injection replacement technology in the 4onm process of integrated circuits.Starting from the mechanism,through experiments,it is found that using normal temperature injection of other elements in the same family to replace low-temperature injection can achieve the same function,thus achieving the requirements of high efficiency and low energy consumption.
作者
陈菊英
祁鹏
时锋
CHEN Juying;QI Peng;SHI Feng(Shanghai Huali Microelectronics Co.,Ltd.,Shanghai 200123,China)
出处
《电子技术(上海)》
2024年第5期16-17,共2页
Electronic Technology
关键词
集成电路制造
常温注入技术
低温注入技术
integrated circuit manufacturing
normal temperature injection technology
low-temperature injection technology.