摘要
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy(STEM)images,aimed at improving structural analysis of materials at the atomic scale.This technique is effective against common imaging noises and is potentially suited for low-dose imaging and identifying quantum defects.We showcase its utility in the unsupervised segmentation of polytypes in a twisted bilayer TaS_(2),enabling accurate differentiation of structural phases and monitoring transitions caused by electron beam effects.This approach enhances the analysis of structural variations in crystalline materials,marking a notable advancement in the characterization of structures in materials science.
作者
Jiadong Dan
Cheng Zhang
赵晓续
N.Duane Loh
Jiadong Dan;Cheng Zhang;Xiaoxu Zhao;N.Duane Loh(Department of Biological Sciences,National University of Singapore,Singapore;Center for Bioimaging Sciences(CBIS),National University of Singapore,Singapore;Department of Physics,National University of Singapore,Singapore;School of Materials Science and Engineering,Peking University,Beijing 100871,China)
基金
funding support from the National Research Foundation (Competitive Research Program grant number NRF-CRP16-2015-05)
the National University of Singapore Early Career Research Award
supported by the Eric and Wendy Schmidt AI in Science Postdoctoral Fellowship
a Schmidt Sciences program。
