基于STM32H7的ADC静态参数测量系统设计

STM32H7-Based ADC Static Parameter Measurement System Design

国内的数字电源已经成为电源类芯片中不可或缺的产品,其内部反馈控制回路中的模数转换器(ADC)芯片精度直接影响整个电源输出的精度和稳定性。ADC静态参数——积分非线性(INL)与微分非线性(DNL)——是评价ADC精度的重要指标,目前国内针对数字电源中ADC的静态参数测试的设备操作复杂、成本高,缺乏相应的灵活性,因此设计一种低成本、易操作的静态参数测试系统尤为重要。设计了一种基于STM32H7的ADC静态参数测试系统,通过试验验证了测试系统的准确性和可行性。

Domestic digital power supply has become an indispensable product in power supply chips,and the accuracy of the analog-to-digital converter(ADC)chip inside its internal feedback control loop directly affects the accuracy and stability of the output of the whole power supply.The static parameters of the ADC,namely integral nonlinearity(INL)and differential nonlinearity(DNL),are the important indexes for evaluating the accuracy of the ADC.At present,the domestic equipment for testing the static parameters of ADC in digital power supply is complicated and costly,and is not independently controllable.Therefore,it is especially important to design a low-cost and easy-to-operate static parameter test system.An ADC static parameter test system based on STM32H7 is designed,and the accuracy and feasibility of the system are verified by experiments.