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扫描电子显微镜用X射线能谱仪在定量分析中的应用

Application of scanning electron microscopy and X-ray energy spectrometer in quantitative analysis
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摘要 扫描电子显微镜用X射线能谱仪分析是元素定量分析的重要手段。对X射线能谱仪定量分析的基本工作原理进行简述,并对X射线能谱仪的定量分析方式、提高定量分析结果准确性的方法,以及定量分析中常见的问题进行了探讨,为进一步提高能谱仪定量分析的准确性提供了一定的参考。 Scanning electron microscopy and X-ray energy spectrometer analysis were important methods for quantitative analysis of elements.The basic working principle of quantitative analysis of X-ray energy spectrometer was briefly described,and discussed the quantitative analysis methods of X-ray energy spectrometer,methods to improve the accuracy of quantitative analysis results,and common problems in quantitative analysis.It provided a certain reference for further improving the accuracy of quantitative analysis of energy spectrometer.
作者 曹艳芬 曹方方 孔强强 宋鹏 辛玲 李海娥 CAO Yanfen;CAO Fangfang;KONG Qiangqiang;SONG Peng;XIN Ling;LI Haie(Jining Institute of Quality&Metrology Inspection,Jining 272000,China;Shandong Provincial Eco-environment Monitoring Center,Ji’nan 250101,China)
出处 《理化检验(物理分册)》 CAS 2024年第9期15-18,共4页 Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词 X射线能谱仪 元素定量分析 加速电压 计数率 谱峰 X-ray energy spectrometer quantitative analysis of element acceleration voltage counting rate spectral peak
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