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基于聚焦离子双束电镜的透射电镜微柱试样制备

Preparation of transmission electron microscopy microcolumn samples based on focused ion beam-scanning electron microscopy
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摘要 利用聚焦离子双束电镜在传统透射电镜试样制备的方法上进行改进,通过改变离子束辅助沉积的区域及作用,以及将U形切改良为L形切,成功提取压缩后的小鼠骨骼微柱试样至专用铜网上。提取出的试样通过离子束精确减薄后,可在透射电镜下观察到胶原纤维走向。 By using focused ion beam-scanning electron microscopy to improve the traditional method of transmission electron microscopy sample preparation.By changing the area and effect of ion beam assisted deposition,and improving the U-shaped cut to L-shaped cut,the compressed mouse bone micro-pillars samples were successfully extracted onto a dedicated copper mesh.The extracted sample could be precisely thinned by ion beam,and the direction of collagen fibers could be observed under transmission electron microscopy.
作者 高倩雯 李怡雪 冯丹 史学芳 GAO Qianwen;LI Yixue;FENG Dan;SHI Xuefang(Analytical&Testing Center,Northwestern Polytechnical University,Xi'an 710072,China)
出处 《理化检验(物理分册)》 CAS 2024年第9期30-33,共4页 Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词 微柱 聚焦离子双束电镜 透射电镜试样 Pt沉积层 L形切 micro-pillar focused ion beam-scanning electron microscopy transmission electron microscopy sample Pt deposition layer L-shaped cut
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