摘要
GaN power electronic devices,such as the lateral AlGaN/GaN Schottky barrier diode(SBD),have received significant attention in recent years.Many studies have focused on optimizing the breakdown voltage(BV)of the device,with a particular emphasis on achieving ultra-high-voltage(UHV,>10 kV)applications.However,another important question arises:can the device maintain a BV of 10 kV while having a low turn-on voltage(V_(on))?In this study,the fabrication of UHV AlGaN/GaN SBDs was demonstrated on sapphire with a BV exceeding 10 kV.Moreover,by utilizing a doublebarrier anode(DBA)structure consisting of platinum(Pt)and tantalum(Ta),a remarkably low Von of 0.36 V was achieved.This achievement highlights the great potential of these devices for UHV applications.
出处
《Chip》
EI
2024年第1期35-42,共8页
芯片(英文)
基金
supported by National Key R&D Project grant No.2022YFE0122700)
National High-Tech R&D Project(grant No.2015AA033305)
Jiangsu Provincial Key R&D Program(grant No.BK2015111)
China Postdoctoral Science Foundation(grant No.2023M731583)
Jiangsu Provincial Innovation and Entrepreneurship Doctor Program,the Research and Development Funds from State Grid Shandong Electric Power Company and Electric Power Research Institute.