期刊文献+

X射线衍射技术在纸张、纸质文物分析和保护研究中的应用

Application of X-Ray Diffraction Technology in Paper and Paper-based Artifacts Analysis and Research
下载PDF
导出
摘要 X射线衍射(XRD)技术作为一种研究物质微观结构的重要手段,在纸张、纸质文物分析和保护研究中有重要的应用,其应用范围不断得到拓展。在纸张、纸质文物分析和保护研究中使用XRD可充分体现其检测时使用所具有的样品用量少、操作简单可行、在检测过程中不会损伤和污染样品等优点。本文对XRD在纸张纤维、填料、涂料、表面颜料检测及其在造纸、纸张鉴定、文物研究与保护等领域中的应用进行了分类介绍。虽然XRD对分析纸张结构信息具有重要作用,适用于样品量少且珍贵的纸张、纸质文物,但该技术在测试范围、多组分物质复合衍射图分析、填料成分细致化鉴别等方面还存在局限,可结合其他方法使用,以便得到被检测物更全面、准确的信息。 As an important means to study the microstructure of substances,X-Ray Diffraction(XRD)technology has an important application in the analysis and protection of paper and paper cultural relics,and its scope of application has been expanded continuously.XRD in the analysis of paper and paper cultural relics and protection of the study has the advantages of small sample dosage,simple and feasible operation,and will not damage and contaminate the samples and so on.In this paper,XRD in paper fiber,filler,paint,surface pigment detection and its application in papermaking,paper identification,cultural relics research and conservation and other fields are classified and introduced.Although XRD plays an important role in analyzing the structural information of paper,and is suitable for paper and paper relics with small amount of samples and preciousness,there are still limitations in the testing range,analysis of composite diffractograms of multi-component substances,and detailed identification of filler components,etc.XRD should be used in combination with other methods in order to obtain more comprehensive and accurate information about the detected materials.
作者 陈彪 朱玥玮 谭静 黄晓雪 芮杨梦琳 王春秀 吴又进 丁延伟 CHEN Biao;ZHU Yuewei;TAN Jing;HUANG Xiaoxue;RUI Yangmenglin;WANG Chunxiu;WU Youjin;DING Yanwei(Department of History of Science and Scientific Archaeology,University of Science and Technology of China,Hefei,Anhui 230026,China;School of Ethnology and Sociology,Guangxi University for Nationalities,Nanning,Guangxi 530006,China;Department of Chemistry,University of Science and Technology of China,Hefei,Anhui 230026,China;Hefei National Laboratory for Physical Sciences at the Microscale,University of Science and Technology of China,Hefei,Anhui 230026,China)
出处 《复旦学报(自然科学版)》 CAS CSCD 北大核心 2024年第5期567-573,共7页 Journal of Fudan University:Natural Science
基金 国家重点研发计划(2022YFF0904501) 安徽省高等学校省级质量工程项目(2017jyxm0018,2019jyxm0014) 安徽省新时代育人质量工程项目(2022szsfkc010,2022jyjxggyj031,2023zyxwjxalk002) 中国科学技术大学校级教学研究项目(2023xjyxm060,2022ycjg14,2022ychx10,2024xjyxm002)。
关键词 X射线衍射技术 纸张鉴定 纸质文物保护 分析应用 X-ray diffraction technology paper identification protection of paper cultural relics analytical application
  • 相关文献

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部