摘要
Identifying sensitive areas in integrated circuits susceptible to single-event effects(SEE)is crucial for improving radiation hardness.This study presents an online multi-track location(OML)framework to enhance the high-resolution online trajectory detection for the Hi’Beam-SEE system,which aims to localize SEE-sensitive positions on the IC at the micrometer scale and in real time.We employed a reparameterization method to accelerate the inference speed,merging the branches of the backbone of the location in the deployment scenario.Additionally,we designed an irregular convolution kernel,an attention mechanism,and a fused loss function to improve the positioning accuracy.OML demonstrates exceptional realtime processing capabilities,achieving a positioning accuracy of 1.83μm in processing data generated by the Hi’Beam-SEE system at 163 frames per second per GPU.
基金
supported by the National Natural Science Foundation of China(Nos.U2032209,12222512,12375193,12305210)
the National Key Research and Development Program of China(No.2021YFA1601300)
the CAS“Light of West China”Program,the CAS Pioneer Hundred Talent Program,the Guangdong Major Project of Basic and Applied Basic Research(No.2020B0301030008).
