静电放电防护技术与案例分析

Electrostatic Discharge Protection Technology and Case Analysis

纳米技术与集成电路的发展,使电子设备性能不断增强的同时也使其敏感度随之增高,由静电放电(ESD)引起的危害也越来越多,严重影响电子设备的安全性与可靠性。文章阐述了静电放电的特点及产生原因,并对静电放电干扰原理、干扰途径与相关标准进行了简单解析。根据实践经验,给出了几种简单高效的静电防护方法。针对某通信产品在静电放电试验中发生的故障现象,结合以往经验,给出了初步定位,之后从设置等电位地、减小回路面积、提高抗干扰能力、增强屏蔽性能等方面给出具体的整改措施,并通过试验验证了措施的有效性。

With the development of nanotechnology and integrated circuits,the performance of electronic devices continues to enhance,while their sensitivity also increases.The hazards caused by electrostatic discharge(ESD)are also increasing,seriously affecting the safety and reliability of electronic devices.The article elaborates on the characteristics and causes of electrostatic discharge,and provides a brief analysis of the principles,pathways,and relevant standards of electrostatic discharge interference.Based on practical experience,several simple and efficient electrostatic protection methods have been proposed.In view of the fault phenomenon that occurred in the electrostatic discharge test of a certain communication product,combined with previous experience,a preliminary positioning was provided.Subsequently,specific rectification measures were proposed from the aspects of setting equipotential ground,reducing circuit area,improving anti-interference ability,and enhancing shielding performance.The effectiveness of the measures was verified through experiments.