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新生儿低血糖及其脑损伤的研究进展

Progress on neonatal hypoglycemia and related brain injury
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摘要 新生儿低血糖是新生儿较常见的代谢问题之一,有相当比例的新生儿有低血糖的风险,即使在健康的新生儿中也存在过渡期低血糖。严重和长时间低血糖与新生儿低血糖性脑损伤(hypoglycemic brain damage,HBD)之间的相关性已得到证实。低血糖、葡萄糖再灌注、血糖波动等因素均在一定程度上参与了HBD的损伤过程。该文就新生儿低血糖相关定义、新生儿血糖代谢特点、HBD的相关机制及可能改善其预后的治疗策略进行综述。 Neonatal hypoglycemia is one of the most common metabolic conditions in newborns.A considerable proportion of newborns are evaluated to be at risk of hypoglycemia,and transitional hypoglycemia is common in healthy newborns.A correlation between severe and prolonged hypoglycemia and neonatal hypoglycemic brain damage(HBD)in newborns has been proven.Factors such as hypoglycemia,glucose reperfusion,and blood glucose fluctuations are all involved in the damage process of HBD to a certain extent.This article reviews the relevant definitions of neonatal hypoglycemia,the characteristics of neonatal blood glucose metabolism,the related mechanisms of HBD,and possible treatment strategies to improve its prognosis.
作者 张庭玮 华子瑜 Zhang Tingwei;Hua Ziyu(Department of Neonatology,Children's Hospital of Chongqing Medical University,National Clinical Research Center for Child Health and Disorders,Ministry of Education Key Laboratory of Child Development and Disorders,Chongqing Key Laboratory of Child Rare Diseases in Infection and Immunity,Chongqing 400014,China)
出处 《国际儿科学杂志》 2024年第10期685-688,共4页 International Journal of Pediatrics
关键词 婴儿 新生 低血糖 低血糖性脑损伤 机制 Infant,newborn Hypoglycemia Hypoglycemic brain damage Mechanism
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