摘要
High-lead solder joints are still playing an indispensable role in military and space applications.Nevertheless,in-depth characterization of high-lead solder joints and the underlying degradation mechanisms remain unexplored.This research first performed aging tests on Sn10Pb90 solder joints,the shear strength at room and elevated temperatures gradually reduced,and the resistance increased.Here,a two-layered Ni-Sn intermetallic compound(IMC)structure was identified using transmission electron microscopy(TEM),which could be attributed to the change of Sn content in the solder.Moreover,the internal annealing twin of a Sn particle was discovered,which could be attributed to creeping induced by thermal expansion coefficient(CTE)difference between Sn and Pb.Detailed analysis of partial and whole annealing twins was conducted through high-resolution TEM(HRTEM).Finally,four degradation mechanisms were proposed.Thickening of the IMC layer would result in increased brittleness and resistivity.For particle coarsening,apart from diminishing the ductility and toughness of the solder joint,it would also accelerate the creeping rate by weakening the phase boundary strength.Regarding voids and cracks induced by phase boundary sliding,wedgeshaped cracking and pore-shaped cracking were discovered and their formation was analyzed.Most importantly,the consumption of Sn resulted in a depletion of wettable layer,leading to the formation of Pb streams and isolated IMC islands,also known as the spalling and delamination of IMCs.Pb diffusion followed a spiral path,which was mutually influenced by orientation misfit and concentration gradient.A technique to prevent cracking was proposed.This research is expected to provide significant technical references for high-lead solder joints.
出处
《Rare Metals》
SCIE
EI
CAS
CSCD
2024年第10期5346-5361,共16页
稀有金属(英文版)
基金
financially supported by Chongqing Natural Science Foundation of China(No.cstc2021jcyjmsxmX1002)
the Ministry of Industry and Information Technology of the People’s Republic of China(Nos.1GWZ2326032 and 302JC22123006)。