纳米尺度铁电畴的扫描力显微镜成像研究进展

Progress in the Imaging of Nanoscale Ferroelectric Domain via Scanning Force Microscope

扫描力显微镜(SFM)作为一种新型的超分辨率近场扫描探针显微仪器正日益受到各学科领域的高度重视.在铁电材料领域,SFM是开展纳米尺度铁电畴结构成像、纳米尺度畴结构控制及纳米尺度微区的铁电性、介电性、压电性等特性研究的潜在的强有力的研究工具.本文就纳米尺度铁电畴的扫描力显微镜的成像原理的研究进展作一综述.

Scanning force microscope (SFM) is paid great attention as a super-resolutional near-field scanning probe microscope in all circles. SFM is becoming a powerful technique with great potential for imaging and control of nanoscale domain structures in ferroelectric materials, and it is a promising technique well suited for nanoscale investigation of local properties including ferroelectricity, piezoelectricity, dielectricity in ferroelectics. This review is involved with the latest progress in the imaging principle of nanoscale ferroelectric domain via SFM.