辐射损伤潜径迹的纳米尺度观测研究

Study on Nano-meter Scale Observation of Latent Tracks Induced by Ions

综述了近年来用扫描隧道显微镜 (STM )和扫描力显微镜 (SFM)在原子水平上观测辐射损伤潜径迹的研究及进展。详述了辐射损伤潜径迹的形貌、损伤范围、损伤数密度、损伤几率等 ,对损伤潜径迹直径与能损的关系、损伤过程及各种可能的损伤机制进行了分析和讨论。

Study on nano-meter scale observation of latent tracks induced by ions are discussed using scanning tunneling microscopy(STM) and scanning force microscopy(SFM). The topography and range of damaged area on the surface of material bombarded by ions and the correlation between damaged number density and ion dose are given. The relationship between diameter of the latent track and energy loss, and the various possible mechanism of damage process are discussed.