用APRGA求解二维导体柱电磁逆散射

Electromagnetic inverse scattering of two-dimensional conducting objects by adaptive parameter real-coded genetic algorithm

从电磁散射的积分方程出发 ,利用点匹配法和脉冲基函数求解电磁散射问题 ,以测量的散射场和计算的散射场的偏差程度为目标函数 ,将待优化变量设置为描述导体柱轮廓的形状函数的傅立叶展开式系数 ,Ai0 ,Ai1…AiN/ 2 ,Bi1,Bi2 …BiN/ 2 ,k =1,2…k ,通过参数自适应实数遗传算法 (APRGA)对待优化变量进行优化 ,使目标函数达到最小值来对自由空间中导体柱族进行电磁成像。证实了APRGA比BRGA有更好的收敛性能和成像精度、更强的抗随机噪声干扰能力。

A point-matching method is used to solve the scattering problem in this paper. The error between measured scattering data and computed scattering data is considered as the object function. The contour of each conducting object is denoted by a shape function which is approximated by a Fourier series. The inverse scattering problem is transfered into an optimization problem by minimizing the object function with the coefficients of Fourier series being the optimization parameters which is solved by the adaptive parameter real-coded genetic algorithm(APRGA). Comparisons of the APRGA with BRGA are carried out. The results show that APRGA has the excellent performance of better convergence and imaging precision, more robust anti-jamming.