电子元器件综合参数测试仪的研制

The development of the digital measurement of electron apparatus integrated parameter

数字化测量技术是面向 2 1世纪的一项高新科学技术 ,应用单片集成电路系统设计开发的新型综合测试仪 ,精度高、显示直观。

It is the digital measurement that is a new technology in 21 centuries.The new measurement that is developed with the single IC(integrated current) has some excellence,such as the high precision and intuitional display.