摘要
在辐射测温中 ,普遍存在一个问题 :被测温度物体表面发射率影响很大 ,而物体的发射率很难准确测量 ,这是因为发射率不仅与材料有关 ,而且还与波长、温度、表面状态 (表面粗糙度、氧化程度等 )有关。本文叙述一种利用多波长辐射法测量实际物体真实温度的方法。该方法利用最小二乘法原理拟合出实际热辐射体的光谱发射率曲线 ,从而使测量目标的真实温度成为可能。
In radiation temperature measurement, there is a common question which is that the effect of surface emissivity of any measured object on the measurement is great and difficult to measure accurately. It is because that emissivity of object is related not only to material but also to wavelength, temperature, surface state(surface roughness, oxidation state etc ). A method which makes use of multi wavelength radiation to measure the real temperature of measured object is introduced in this paper. The least square principle is used to simulate spectral emissivity curve of the thermal radiator.Therefore, it is possible to measure real temperature of any measured object.
出处
《应用光学》
CAS
CSCD
2002年第6期39-41,44,共4页
Journal of Applied Optics