摘要
采用混合器件模型研究了局域寿命控制技术对快速软恢复功率二极管静态和动态特性的影响 ,模拟结果表明 :低寿命区的最佳位置处于基区靠近阳极 ,其最佳宽度取决于载流子寿命减少的数量。
The effects of localized lifetime control technique on the static and dynamic characteristics of a power PIN diode are investigated by use of mixed device circuit model. The simulations show that the optimal position for the low-lifetime region is at the beginnig of the base region on the anode side, while the optimal width of the low-life-time region depends on the amount of carrier lifetime reduction.
出处
《电力电子技术》
CSCD
北大核心
2002年第6期70-72,共3页
Power Electronics
