摘要
多晶硅铸锭过程中,在石英坩埚内壁制作高纯隔离层可以阻挡石英坩埚中的杂质向硅锭中扩散,改善硅方的边部红区,但高纯隔离层会引起硅锭中氧含量的升高。本文在高纯隔离层的基础上,通过级配的方法提升高纯隔离层结构的致密性并降低硅锭中的氧含量。
In the directional solidification growth of multi-crystalline silicon( mc-Si) ingot,to decrease the proportion of the red-zone near the edge of the ingot,high purity barrier layer was coated onto the inner walls of the silica crucible to prevent the diffusion of impurities from the crucible into the silicon ingot. But the high purity barrier layer can increase the content of oxygen in the silicon ingot. In this paper,the recipe of the high purity barrier layer have been optimized to improve its compactness,and the content of oxygen in the silicon ingot have been decreased.
出处
《硅酸盐通报》
CAS
CSCD
北大核心
2015年第S1期75-77,共3页
Bulletin of the Chinese Ceramic Society
基金
陕西省重点学科建设专项资金资助项目
陕西省科学技术研究发展计划工业攻关项目(2014K08-35)
关键词
多晶硅
隔离层
级配
氧含量
multi-crystalline silicon
barrier layer
granular composition
oxygen content