摘要
负载牵引(Load pull)测试系统是一个复杂的微波测试系统,在不同的频段有不同的实现方案以及测试误差。本文从Load pull系统及待测器件的固有特性出发,分析了系统高频测试误差产生的原因,并且提出了一种提高系统高频测试精度的新型测试方案。
Load pull systems are complex microwave measurement systems which have different setup and test error in accordance to the measurement frequency band.From the inherent characteristics of load pull systems and the tested devices,the origination of the high-frequency test error was analyzed,and a novel measure method was presented for the improvement of the high-frequency test precision by load pull system.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
2016年第4期312-317,共6页
Research & Progress of SSE
关键词
负载牵引
在片高频负载牵引
毫米波负载牵引
load pull
high frequency load pull on wafer
millimeter microwave load pull