期刊文献+

半导体激光器退化表征与嵌入式测试 被引量:2

Degradation characterization and embedded test of laser diode
下载PDF
导出
摘要 半导体激光器(LD)广泛应用于国防和经济的诸多领域,其精密化和集成化程度高,给嵌入式在线监测带来一定挑战。对LD有源区退化和腔面退化,在LD经典等效电路模型基础上,构建了可模拟退化过程的等效电路模型;经过仿真和对比分析,得出阈值电流和斜率效率可分别表征这两种退化的结论;针对这两个表征参数在线监测难问题,提出在LD现有监测参数基础上,补充监测调制电流,以及利用调制电流和其他已监测参数在线计算阈值电流和斜率效率的方法,并给出了调制电流的嵌入式测试方案,最后通过实物实验验证了仿真模型的准确性和嵌入式测试方法的有效性。 Laser diode(LD)is widely applied in defense and economic fields.There is a great challenge to make embedded and online test on account of its precise and integration.The thesis construct an equivalent circuit model which can simulate LD’s active region degradation and cavity surface degradation.The fact is discovered that the threshold current and slope efficiency can characterize the two degradation modes respectively by simulating and comparing.A novel method is presented that an extra parameter namely modulating current shall be monitored,and the two characterizations can be calculated online through the modulating current and some monitored parameters.An embedded tests scheme of the modulating current is presented.The accuracy of the simulation model and the efficiency of the embedded test are validated through physical experiments in the end.
作者 杨鹏 胡业荣 Yang Peng;Hu Yerong(Science and Technology on Integrated Logistics Support Laboratory,National University of Defense Technology,Changsha 410073,China)
出处 《国外电子测量技术》 2019年第3期97-102,共6页 Foreign Electronic Measurement Technology
基金 青年科学资金项目(51605482)资助
关键词 半导体激光器 嵌入式测试 表征参数 阈值电流 斜率效率 laser diode embedded test characteristic parameter threshold current slope efficiency equivalent circuit model
  • 相关文献

参考文献2

二级参考文献9

  • 1潘金都.浅谈光纤通道技术[J].有线电视技术,2004,11(21):40-42. 被引量:2
  • 2SHAN Jiang-dong TIAN Xiao-jian DENG Jun ZHANG Shuang.Research and design of the protection circuits in LD controller[J].The Journal of China Universities of Posts and Telecommunications,2006,13(4):73-76. 被引量:1
  • 3[4]MAXIM.155Mbps to 622Mbps SFF/SFP Laser Driver with Extinction Ratio Control[EB/OL].(2004-07-10)[2007-09-03].http://www.maxim-ic.com.cn/pdfserv/en/ds/MAX3646.pdf.
  • 4[6]MAXIM.200Mbps SFP Limiting Amplifier[EB/OL].(2006-06-20)[2007-09-03].http://www.maxim-ic.com.cn/pdfserv/en/ds/MAX3969.pdf.
  • 5[7]GOETZ M.Time and frequency domain analysis of integral decoupling capacitor[EB/OL].(1996-03-08)[2007-09-03].http://ieeexplore.ieee.org/ie14/96/11172/00533890.pdf?arnumber=533890.
  • 6Bonfiglio A, VanziM, Magistrali F, et al. Interpretation of Sudden Failures in Pump Laser Diodes [A] . Proc. of the International Symposium on Testing and Failure Analysis,ISTFA[C]. 1997. 189 - 194.
  • 7Magistrali F, Sala P, Vanzi M, et al. Failure analysis of GaAs/GaAlAs laser diodes[A]. Proc. of the International Symposium on Testing and Failure Analysis , ISTFA [ C ].1990. 291-299.
  • 8Malberti P, Ciappa M. The Thermal Resistance Measurement: An Efficient Failure Analysis Tool for Laser Diodes[A].Proc. Of the International Symposium on Testing and Failure Analysis, ISTFA[C]. 1994.97 - 105.
  • 9Mitsuo Fukuda. Reliability and Degradation of Semiconduc tor Lasers and LEDs[M]. London: Artech House Boston,1991.

共引文献9

同被引文献3

引证文献2

二级引证文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部