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干涉图去包裹位相的二次校正 被引量:1

Double Revising after Phase Unwrapping of Interference Patterns
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摘要 相位去包裹是移相干涉技术中关键的组成部分。一些去包裹算法在处理具有较多无效成像点的干涉图时,会在处理结果中引入较大的算法误差。提出了通过对去包裹位相进行二次校正的方法,实现去包裹位相算法误差的有效消除。文中通过基于DCT变换的最小二乘去包裹算法为例进行了说明,并通过一光学平晶表面的处理结果对方法进行了验证。 Phase unwrapping is a key segment in phase-stepping technique. A big error will occur when using some phase unwrapping algorithms to process the interference patterns with many invalid imaging points. The paper presents a double revising method to process unwrapping phase to remove its algorithm error. The paper uses the least-squares algorithm by the discrete cosine transform (DCT) as an example to explain this method. The test results of an optical flat testify its correctness.
出处 《仪器仪表学报》 EI CAS CSCD 北大核心 2002年第5期537-539,543,共4页 Chinese Journal of Scientific Instrument
基金 上海市教育委员会青年基金资助项目。
关键词 移相干涉技术 去包裹算法 二次校正 Phase-stepping interferometry Phase-unwrapping algorithm Double revising
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