摘要
通过大量实验,对不同Sr/Ba比制作的SBBT高压陶瓷电容器的击穿特性进行了研究,指出瓷体中的局部还原现象是造成电容器瓷片击穿场强严重下降的原因所在。经过理论分析,提出施主离子Bi3+在固溶体中的不均匀分布导致瓷体还原的新观点。在此基础上,通过加入受主离子Mg2+克服了还原现象,使电容器的击穿场强大幅度提高。
The high voltage SBBT ceramic capacitors with various ratio of Sr/Ba were tested to research their electrical breakdown characteristics. It was pointed out that the reduction of Ti4+ in the part of the ceramic should be the reason of decrease of capacitors' breakdown strength. The new, view was put forward that the reduction was related to the non-uniform distribution of donor Bi3+ in ceramic. The reduction was overcome by addition of acceptor Mg2+, and the breakdown strength of the capacitors was enhanced greatly.
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
2002年第6期480-482,共3页
Rare Metal Materials and Engineering
基金
国家自然科学基金资助项目(59777015)