摘要
本文介绍了一种新型半导体激光二极管 (LD)参数连续测试系统 ,它采用了高精度的数据采集技术、超强的数据处理技术及精密机械定位技术 ,可对LD的P -I和V -I曲线及相关参数进行连续测试、显示、存储、管理和打印 ,测量速度快 ,测量精度高 。
This paper introduces a new type of continuous testing system of LD,it adopts the technology of high precise data sampling,strong data processing and the technology of exact mechanical orientation.The system can not only plot power-current curve and voltage-current curve of LD,and test multi-parameters,but also test continuously,display,storage,manage and print.In addition,it measures quickly and highly precision,manipulate conveniently.
出处
《激光杂志》
CAS
CSCD
北大核心
2002年第6期28-29,共2页
Laser Journal