铁电薄膜开关特性理论可靠性分析

Reliability of Ishibashi-Takagi′s Theory for Switching Characteristics of Ferroelectric Thin-Film

将 Ishibashi- Takagi的 类和 类铁电薄膜开关特性理论与同时考虑两种类型的理论结果进行了比较 ,研究结果表明 ,Ishibashi- Takagi理论较合理地反应了铁电薄膜中电畴反转特征 ,仅在较小范围内有必要考虑 、

The Ishibashi Takagi theory on the switching characteristics of ferroelectrics for categories Ⅰ and Ⅱ are compared with results obtained by considering joined effect of both categories. It is found that the Ishibashi Takagi theory reflects reasonably the kinetic characteristics of domain reversals in ferroelectric thin films, but in some cases a cooperative model of both categories is more acceptable.