摘要
应用电子耦合摄像器件(CCD)一维扫描和试样的行进构成对试样的二维扫描检测方法,研制了XLPE电缆料杂质颗粒测量系统。论文分析了透镜、CCD器件对分辨率的影响,在选定扫描视场下优化了分辨率:测量系统分辨率在20mm视场下达到35μm,模板实验测中率为100％,测量每公斤料的颗粒误判率为零。用于110kV交联电缆绝缘料测量,最小颗粒为120μm时,测量速度可达2.6kg/h。
A contaminant particle inspection system for cross-linking polyethylene (XLPE) cable insulating material has been developed. Charge coupled device (CCD) opti-electronic device combined with mechanical driving is used to form two-dimensional scanning for sampling. Influence of optics on the resolution is deduced theoretically and proved experimentally. The system has the resolution of 35μm with 20mm scanning width. 100% particles in testing module can be detected. The counting error in per kg compound was zero. For the testing of 110kV XLPE insulating compound, 2.6kg compound can be inspected per hour with the resolution of 120μm.
出处
《电机与控制学报》
EI
CSCD
北大核心
2002年第4期342-345,349,共5页
Electric Machines and Control
