摘要
多层片式陶瓷电容器 (MLCC)容量命中率低是生产中普遍存在的问题。本文通过微观结构、金属层和介质层厚度、以及工序因素分析 ,探讨了引起MLCC容量分散的主要原因 ,提出了工序中应控制的因素 ,为MLCC生产过程控制、提高容量命中率提供了依据。
The low yield of MLCC's Capacitance is a ubiquitous question. Microstructure, metal layer and dielectric layer, working produre factor has been researched. It is discussed that the major cause which lead to capacitance decentralization. Put forward controlling factor in working procedure, offer the gist by which MLCC procedure controll, improve the yield of MLCC's Capacitance.
出处
《材料科学与工程》
CSCD
北大核心
2003年第1期72-75,共4页
Materials Science and Engineering
