摘要
The processing method applied to the side surface is different from the method applied to the light pass surface in neodymium phosphate glass(Nd:glass), and thus subsurface defects remain after processing. The subsurface defects in the side surface influence the gain uniformity of Nd:glass, which is a key factor to evaluate the performance of amplifiers. The scattering characteristics of side subsurface defects were simulated by finite difference time domain(FDTD) Solutions software. The scattering powers of the glass fabricated by a computer numerical control(CNC)machine without cladding were tested at different incident angles. The trend of the curve was similar to the simulated result, while the smallest point was different with the complex true morphology. The simulation showed that the equivalent residual reflectivity of the cladding glass can be more than 0.1% when the number of defects in a single gridding is greater than 50.
The processing method applied to the side surface is different from the method applied to the light pass surface in neodymium phosphate glass(Nd:glass), and thus subsurface defects remain after processing. The subsurface defects in the side surface influence the gain uniformity of Nd:glass, which is a key factor to evaluate the performance of amplifiers. The scattering characteristics of side subsurface defects were simulated by finite difference time domain(FDTD) Solutions software. The scattering powers of the glass fabricated by a computer numerical control(CNC)machine without cladding were tested at different incident angles. The trend of the curve was similar to the simulated result, while the smallest point was different with the complex true morphology. The simulation showed that the equivalent residual reflectivity of the cladding glass can be more than 0.1% when the number of defects in a single gridding is greater than 50.
基金
supported by National Natural Science Foundation of China (No.61205212)
