摘要
本文介绍一种新型的通用大、中、小规模数字集成电路功能测试仪的组成、工作原理及主要软硬件的设计.该仪器具有很高的性能/价格比,适宜在我国推广使用.
This paper introduces the test principle and construction of a new digital LSI/MSI functional tester. The main hardware and softwear are explained. The instrument adopts both the deterministic testing and random testing methods. It has high performance/cost ratio.
出处
《电子测量与仪器学报》
CSCD
1992年第1期30-34,共5页
Journal of Electronic Measurement and Instrumentation
