密封电子元器件内部水汽含量问题探讨

Problem of Internal Water Vapor Content in Domestic Sealed Device

提出了国产密封电子元器件封装内部水汽含量高的问题,阐述了内部水汽对元器件性能与可靠性的 影响,探讨了降低内部水汽含量的主要技术途径。

The problem of higher internal water vapor content in domestic sealed device was observed. The effects of the internal water vapor on the performance and reliability of device was discussed. The main method to decrease the internal water vapor content was introduced.