低成本高故障覆盖率内建自测试方案

Efficient BIST Scheme with Higher Fault Coverage and Less Hardware over Head

提出了一个基于重复播种的新颖的BIST(build -inself-test)方案 .它使用侦测随机向量难测故障的测试向量作为种子 ,并利用种子产生过程中剩余的随意位进行存储压缩 .通过最小化种子的测试序列以减少测试施加时间 .实验表明 ,本方案需要外加硬件少 ,测试施加时间较短 ,而故障覆盖率高 。

This paper presents a novel BIST(build-in self-test) approach by reseeding an LFSR.It adopts test patterns used to detect random pattern resistant faults as its seeds. Don't care bits in those seeds,which are remained during the process of test pattern generation by an ATPG tool,are utilized to reduce the size of storage of a seed array. Experimental results show that the proposed approach is able to achieve higher fault coverage,which is approximately equal to that of an ATPG on which the approach depends,and needs less external hardware overhead for synthesis,and consumes less time of test pattern application.