多族晶面的迹线分析

Polyfamily Plane Trace Analysis

导出了多族晶面迹线夹角的计算公式,由之可以确定在接近零倾动时任何晶系一定取向的薄晶中多族迹线所由产生的晶面族。通过对GH36合金晶间VC薄膜中滑移痕迹的分析和位错切割通过VC粒子的强化机制的确定,对Cr27铸铁中马氏体孪晶和高次孪晶的详尽分析及M_7C_3中{013}孪晶的发现,证明这是一种可取的严密计算方法。

The formual for calculating included angle between polyfamily plane traces was deduced,from the formula, the plane families produced polyfamily traces in foil in given orientation of lattice systems can be determined un-der state of zero-tilted. From the method,the slip traces in intergranular VC foil can be indexed and a strengthen mechanism by which dislocations pass through VC particles in GH36 superalloy were determined,and in a CrY7 cast iron,a detailed analysis of twin and higher twin in martensite has been made and (013} twin in MzC3 was,discorered. Therefore,the calculating method is desirable.