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半导体器件的发展与固态纳米电子器件研究现状 被引量:2

Development of semiconductor device and research of solid nanoelectron device
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摘要 简要回顾了半导体电子器件由真空电子管到固体晶体管,直至纳米电子器件的发展历程。分别比较了不同的半导体电子器件的材料、理论和所采用的制备技术。在此基础上综述了当前较热门的纳米电子学和固态纳米电子器件,并由纳米器件的分类简单介绍了当前固态纳米电子器件的三个部分,即量子点、谐振隧穿器件和单电子晶体管。最后对半导体器件的发展提出了展望。 In this paper,the developing course of semiconductor electron device is simply retro-spected,which mainly includes the vacuum tube,solid transistor and nanoelectron device.And the materials,theories and manufacture techniques adopted by different semiconductor electron device are compared.On the base of which,the nanoelectronics and solid nanoelectron device are reviewed.The classification of nanometer device and solid nanoelectron devices including quantum dot and resonance tunnel device and single electron transistor are reviewed.Finally,the development and expectation are put forward.
出处 《微纳电子技术》 CAS 2003年第1期6-11,共6页 Micronanoelectronic Technology
关键词 半导体器件 纳米 电子器件 研究现状 纳米电子学 单电子器件 量子点 nano-electronics nano-electron device SET quantum dot
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  • 1彭英才.半导体超晶格物理与器件(终篇)[J].半导体杂志,1996,21(3):50-55. 被引量:1
  • 2蒋建飞,纳米电子学
  • 3David Goldhaber-gordon et al. Overview of Nanoelectronic Deviees; Proceeding of the IEEE, 1997, 85 (4): 521.
  • 4Zhuang L et al. 1997 IEEE, IEDM'97-167.
  • 5Thornton T J. Mesoscopic devices. Rep Prog Phys, 1994, 57:311.
  • 6Yano K et al. 1998 IEEE Intern. Solid State Circuits Conference, 1998, 344.
  • 7Ledentsov N N, Shchukin V A, Grundmann M et al. Phvs Rev B, 1996, 54: 8743.
  • 8Wang Z G, Liu F Q, Liang J B et al. Seienee in China,2000, 43: 861.
  • 9Haffaker D. L, Park G, Zhou A et al. Appl Phys Lett, 1998,73: 2564.
  • 10Mukai K, Nakata Y, Otsubo K et al.IEEE Photonies Teehnology Lett, 1999, 11: 1205.

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同被引文献20

  • 1徐毅,叶孝佑,李成阳,许婕,高峰.测量微位移的法-珀干涉仪[J].计量学报,1993,14(2):94-98. 被引量:10
  • 2王春和,叶声华.双法—珀光纤干涉仪及条纹定位法读数[J].仪器仪表学报,1994,15(1):18-21. 被引量:5
  • 3翁寿松.量子效应器件正在崛起[J].电子与封装,2005,5(7):1-5. 被引量:3
  • 4张亦奕,贺节,商广义,姚骏恩.原子力显微镜[J].光学学报,1995,15(1):112-116. 被引量:8
  • 5G. Binnig, H. Rohrer, et al.. Surface studies by scan-ning tunneling microscopy. Phys. Rev. Lett.1982,49(1):57-61.
  • 6S. Alexander,L. Hellemans,et al.An atomic-resolution atomic-force microscope implemented using an optical lever. J. Appl. Phys. ,1989,65(1):164-167.
  • 7E. Teague. The National Institute of Standards and Technology molecular measuring machine project. J.Vac. Technol. B7,1989,1898-1902.
  • 8A.Franks.Nanometric surface metrology at the national physical laboratory. Metrologia.1992,28(6):471-482.
  • 9D G Chetwynd, N O Krylova, S T Smith. Metrological x-ray interferometry in the micrometre region.Nanotechnology, 1996,7(1) :1-12.
  • 10H Kunzmanm.Nanometrology at PTB.Metrologia.1992,28(6):443-454.

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