摘要
本文通过离子探针实验首次证实了电致发光老化过程中铜离子由晶格最深部向颗粒表面迁移的事实.这结论与正电子湮灭寿命谱,顺磁共振实验所得结论是相互支持的.实验结果还表明,经过退火和淬火的材料,铜在颗粒中分布发生了变化,析出的铜聚集在颗粒表面上.形成了高场所必需的硫化锌-硫化铜结,增加了势叠高度和场分布的不均匀性,减缓老化过程中铜离子由晶格内部向表面的迁移,因而改善了电致发光老化. 改进后的材料,在5kHz,200V激发下,发光屏初始亮度为450cd/m^2,老化4000小时后,亮度为125.5cd/m^2.若改用喷屏法制屏,增大介质的介电常数,发光屏初始亮度最大值可达766cd/m^2.
This paper deals with the investigation on the deterioration of powder ACEL phosphor using ion probe experiment.lt is found for the first time that copper ions migrate during the deterioration.This conclusion is in accordance with positron annihilation lifetime spectrum.It is also shown that the degree of copper ion migration was alleviated for annealed and quenched phosphor.The initial brightness of ACEL sample was 450cd/m2 under the excitation of 5kHz and 200 V. It decreased to 125.5cd/m2 after the aging of 4000 hours.The maximum of initial brightness for samples with improved phosphor is 766cd/m2.
出处
《发光学报》
EI
CAS
CSCD
北大核心
1992年第2期154-158,共5页
Chinese Journal of Luminescence
